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Facilities & equipment

Microscopes
X-ray devices
Furnaces
Other devices

    Microscopes

Raster electron microscope
Zeiss DSM 960
with Link EDX system
contact:
A. Danilewsky
Tel. 203-6450

Raster electron microscope
LEO 1525 field emission
with Oxford/Link
electron back scattering detector EBSD
contact:
A. Danilewsky
Tel. 203-6450

Light microscope
Leitz Aristomet
(differential interference contrast
acc. to Nomarski)
contact:
A. Danilewsky
Tel. 203-6450

Light microscope
Zeiss Axio Imager
(differential interference contrast
acc. to Nomarski)
contact:
A. Danilewsky
Tel. 203-6450

Infra red microscope
Reichert Jung
contact:
A. Danilewsky
Tel. 203-6450

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    X-ray devices

5-crystals diffractometer
Seifert XRD 3003 PTSHR
contact:
A. Danilewsky
Tel. 203-6450

Laue goniometer
contact:
A. Danilewsky
Tel. 203-6450

Powder diffractometer
Stoe STADI-P
contact:
T. Sorgenfrei
Tel. 203-6453

Single crystal X-ray cameras
contact:
T. Sorgenfrei
Tel. 203-6453

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    Furnaces

FMF
(Float zone furnace with rotating Magnetic Field)
contact:
A. Hess
Tel. 203-6457

Mirror furnace
crystal growth in static and dynamic magnetic fields
contact:
A. Cröll
Tel. 203-6439

Bridgman furnaces
contact:
M. Fiederle , Tel. 203-4775
T. Sorgenfrei , Tel. 203-6453

HF Czochralski furnace
(Zone melting device)
contact:
A. Danilewsky
Tel. 203-6450

Two-zone furnaces
(vertical and horizontal)
for small amount synthesis and crystal growth
contact:
T. Sorgenfrei
Tel. 203-6453

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    Other devices

Liquid phase devices and liquid phase electroepitaxy devices
contact:
A. Danilewsky
Tel. 203-6450

Space-resolved photoluminescence device
contact:
A. Danilewsky, Tel. 203-6450
M. Fiederle, Tel. 203-4775

Thermoanalytic devices
(DTA, DSC, TG)
contact:
T. Sorgenfrei
Tel. 203-6453

Special devices
for semiconductor technology
(z.B. Innenlochsägen)
contact:
A. Danilewsky
Tel. 203-6450

Machine shop machines
contact:
W. Drayer
Tel. 203-6435

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Letzte Aktualisierung 30.03.2012 - Webmaster
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