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Publikationen (unvollständig)

2009

J. Fischer, A. Ebinger, T. Hägi, B. Stawarczyk, A. Wenger, E. Keller
Mold filling and dimensional accuracy of titanium castings in a spinel-based investment
Dental Mat. 25 (2009) 1376–1382

A. Cröll, M. P. Volz
A Standard Crystal Growth Method with a new Twist
Mat. Res. Bull., 2009; 34 (4): 245-250

Cröll A., Mitric A., Aniol, O., Schütt, S., Simon, P.
Solutocapillary convection in Ge - Si melts
Cryst Res Technol, 2009: DOI: http://dx.doi.org/10.1002/crat.200900435

Danilewsky A., Cröll A., Tonn, J., Schweizer, M., Lauer, S., Benz, K. W., Tuomi, T, Rantamäki, R., McNally, P., Curley, J.
Dislocations and Dislocation Reduction in Space Grown GaSb
Cryst Res Technol, 2009, DOI: http://dx.doi.org/10.1002/crat.200900468

Danilewsky A., Wittge, J., Hess, A., Cröll A., Allen, D., McNally, P., Vagovice, P., Cecilia, A., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Elizalde, M. R.
Dislocation Generation Related to Microcracks in Si-Wafers: High Temperature In Situ Study with White Beam X-Ray Topography
J. Nucl. Instr. Meth. B, 2009; DOI: http://dx.doi.org/10.1016/j.nimb.2009.09.013

2008

A. Danilewsky, A. Rack, J. Wittge, T. Weitkamp, R. Simon, H. Riesenmeier and T. Baumbach
White Beam Synchrotron Topography Using a High Resolution Digital X-Ray Imaging Detector
J. Nucl. Sci. Technol. B 266 (2008), 2035-2040

A. Lankinen, T. Lang, S. Suihkonen, O. Svensk, A. Säynätjoki, T. Tuomi, P. McNally, M. Odnoblyudov, V. Bougrov, A.N. Danilewsky, P. Bergmann and R. Simon
Dislocations at the interface between sapphire and GaN
J. Mater. Sci-mater. El. 19 (2008), 143-148

S. Müller, O. Schäfer and E. Keller
Rock salt-Urea-Water (1/1/1) at 293 and 117 K
Acta Cryst. C64 (2008), m300-m304

E. Keller and C. Röhr
Structural changes within and between the two isotypic series ABiO2 (A = Na, K, Rb, Cs) and ASbO2 (A = K, Rb, Cs)
Z. Kristallogr. 223 (2008), 431-440

M. Bou Sanayeh, P. Brick, B. Mayer, M. Müller, M. Reufer, W. Schmid, K. Streubel, S. Schwirzke-Schaaf, J.W. Tomm, A.N. Danilewsky and G. Bacher
Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage
J. Mat. Sci.: ;Mat. El. 19(1) (2008), 155-159

A. Danilewsky, J. Wittge, A. Rack, T. Weitkamp, R. Simon, T. Baumbach, P. McNally
White Beam Topography of 300 mm Si -Wafer
J. Mat. Sci.: Mat. El. 19(1) (2008), 269-272

A. Säynätjoki, A. Lankinen, T. Tuomi, P. McNally, A.N. Danilewsky, Y. Zhilyaev, L. Fedorov
Dislocations in GaAs p-i-n diodes grown by hydride vapour phase epitaxy
J. Mat. Sci.: Mat. El. 19(2) (2008), 149-154

A. Danilewsky, A. Rack, J. Wittge, T. Weitkamp, R. Simon, H. Riesemeier and T. Baumbach
White Beam Synchrotron Topography Using a High Resolution Digital X-Ray Imaging Detector
Nucl. Instrum. Meth. B, 266(9) (2008). 2035-2040

2007

I. Brazil, P. McNally, N. Ren, L. O'Reilly, A.N. Danilewsky, T. Tuomi, A. Lankinen, A. Säynätjaki, R. Simon, S. Soloviev, L.B. Rowland, P.M. Sandvik
An X-ray topographic analysis of the crystal quality of globally available SiC wafers
Mater. Sci+ 2007; 556-557: 227-230

A. Lankinen, T. Lang, S. Suihkonen, O. Svensk, A. Säynätjoki, T. Tuomi, P. McNally, M. Odnoblyudov, V. Bougrov, A.N. Danilewsky, P. Bergmann and R. Simon
Dislocations at the interface between sapphire and GaN
J. Mater. Sci-mater. El., 2007 (online) : http://DOI 10.1007/s10854-007-9307-4

E. Keller and V. Krämer,
Bi5O7Br and its structural relation to Bi5O7I
Acta Crystallogr. C63 (2007), i109-i111

E. Keller and V. Krämer
Crystal Structure of the Trihydrate of the Neuraminidase Inhibitor C15H28N4O4 (Peramivir), a Potential Influenza A/B and Avian-influenza (H5N1) Drug
Z. Naturforsch. 62b (2007), 983 – 987

E. Keller, V. Krämer and C. A. Meyer
Syntheses of the new compounds NaBi6O9X (X = Br, I) and the mixed systems Na0.77(3)K0.23(3)Bi6O9I, Rb0.91(3)K0.05(1)Na0.04(2)Bi6O9Br and Rb0.89(4)K0.05(1)Na0.06(3)Bi6O9I
Mat. Res. Bull. 42 (2007), 1391-1394

2006

R. Lantzsch, I. Grants, V. Galindo, O. Pätzold, G. Gerbeth, M. Stelter, A. Cröll
Fluid flow analysis and vertical gradient freeze crystal growth in a travelling magnetic field
Magnetohydrodynamics 42 (2006), 445-449

D. Noonan, P. J. McNally, W. M. Chen, A. Lankinen, L. Knuuttila, T. Tuomi, A. N. Danilewsky and R. Simon
The evaluation of mechanical stressesdeveloped in underlying silicon substrates due to electroless nickel under bump metallization using synchrotron x-ray topography
Microelectronics J. 37(11) (2006), 1372-1378

E. Keller and V. Krämer
"Ionic" size differences from bond-valence parameters and from ionic radii
Acta Cryst. B62 (2006), 411-416

E. Keller and V. Krämer
Experimental versus expected halide-ion size differences; structural changes in three series of isotypic bismuth chalcogenide halides
Acta Crystallographica B62 (2006), 417-423

R. Boger, M. Fiederle, L. Kirste, M. Maier and J. Wagner
Molecular Beam Epitaxy and doping of AlN at high growth temperatures
J. of Applied Physics D (2006)

A. E. Bolotnikov, G. C. Camarda, G. A. Carini, M. Fiederle, L. Li, S. McGregor, W. McNeil, G. W. Wright and R. B. James
Performance characteristics of Frisch-ring CdZnTe detectors
IEEE Transactions on Nuclear Science 53 (2006), 607-614

J. Franc, E. Elhadidy, V. Babentsov, A. Fauler and M. Fiederle
Comparative study of vertical gradient freeze grown CdTe with variable Sn concentration
J. of Materials Research 21(4) (2006), 1025-1032

P. Dold, F. R. Szofran and K. W. Benz
Thermoelectromagnetic convection in vertical Bridgman grown germanium–silicon
J. Crystal Growth 291(1) (2006), 1-7

W. Neumann and K. W. Benz
40 years Crystal Research and Technology
Crystal Research and Technology 41(1) (2006)

2005

O. Pätzold, K. Jenkner, S. Scholz and A. Cröll
Detached growth of two inch germanium crystals
J. of Crystal Growth 277 (2005), 37-43

A. Lankinen, T. Tuomi, J. Riikonen, L. Knuuttila, H. Lipsanen, M. Sopanen, A. Danilewsky, P. J. McNally, L. O’Reilly, Y. Zhilyaev, L. Fedorov, H. Sipilä, S. Vaijärvi, R. Simon, D. Lumb and A. Owens
Synchrotron X-ray topographic study of dislocations and stacking faults in InAs
J. Crystal Growth 283 (2005), 320-327

J. Riikonen, T. Tuomi, A. Lankinen, J.Sormunen, A. Säynätjoki, L. Knuuttila, H. Lipsanen, P. J. McNally, L. O'Reilly, A. N. Danilewsky, H. Sipilä, S. Vaijärvi, D. Lumb and A. Owens
Synchrotron X-ray topography study of defects in InSb p-i-n structures grown by metal organic vapour phase epitaxy
J. Materials Science: Materials in Electronics 16 (2005), 449 - 453

E. Keller and V. Krämer
A Strong Deviation from Vegard`s Rule: X-Ray Powder Investigations of the three Quasi-Binary Phase Systems BiOX-BiOY (X, Y = Cl, Br, I)
Zeitschrift für Naturforschung 60B (2005), 1255-1263

V. Babentsov, J. Riegler, J. Schneider, O. Ehlert, T. Nann and M. Fiederle
Deep level defect luminescence in cadmium selenide nano-crystals films
J. of Crystal Growth 280(3-4) (2005), 502-508

V. Babentsov, J. Riegler, J. Schneider, M. Fiederle and T. Nann
Excitation dependence of steady-state photoluminescence in CdSe nanocrystal films
J. of Physical Chemistry B 109(32) (2005), 15349-15354

J. Franc, E. Elhadidy, V. Babentsov, A. Fauler and M. Fiederle
Comparative study of the VGF grown CdTe with variable Sn concentration
J. of Material Research (2005)

K. Lin, P. Dold and K. W. Benz
Numerical Study of Influences of Buoyancy and Solutal Marangoni Convection on Flow Structures in a Germanium-Silicon Floating Zone
Crystal Research and Technology 40(6) (2005), 550-556

K. Lin, P. Dold, H. Figgemeier and K. W. Benz
Numerical modelling and investigation of liquid phase epitaxy of Hg1-xCdxTe infrared detectors
Crystal Research and Technology 40 (2005), 832-838

2004

M. Bellmann, O. Pätzold, U. Wunderwald and A. Cröll
Axial Macrosegregation in Ga-Doped Germanium grown by the Vertical Gradient Freeze Technique with a Rotating Magnetic Field
Crystal Research and Technology 39 (2004), 193-197

T. Lyubimova, A. Cröll, P. Dold, O. A. Khlybov and I. S. Fayzrakhmanova
Time-dependent magnetic field influence on GaAs crystal growth by vertical Bridgman method
J. of Crystal Growth 266 (2004), 404-410

O. Pätzold, U. Wunderwald, M. Bellmann, P. Gumprich, E. Buhrig and A. Cröll
New Developments in Vertical Gradient Freeze Growth
Advances in Engineering Materials 6/no.7 (2004), 554-557

P. Dold
Analysis of microsegregation in RF-heated floatzone growth of silicon - comparison to the radiation-heated process
J. Crystal Growth 261 (2004), 1-10

T. Lyubimova, A. Cröll, P. Dold, O. A. Khlybov and I. S. Fayzrakhmanova
Time-dependent magnetic field influence on GaAs crystal growth by vertical Bridgman method
J. of Crystal Growth 266 (2004), 404-410

P. J. McNally, J. Kanatharana, B. H. W. Toh, D. W. McNeill, T. Tuomi, A. N. Danilewsky, L. Knuuttila, J. Riikonen and J. Toivonen
Semicond. Sci. Technol. 19(11) (2004), 1280-1284
Comparison of induced stresses due to electroless versus sputtered copper interconnect technology"

P. J. McNally, J. Kanatharana, B. H. W. Toh, D. W. McNeill, A. N. Danilewsky, T. Tuomi, L. Knuuttila, J. Riikonen, J. Toivonen and R. Simon
J. Appl. Phys. 96(12) (2004), 7596-7602
Geometric linewidth and the impact of thermal processing on the stress regimes induced by electroless copper metallization for Si intergrated circuit interconnect technology

H. Oppermann, U. Petasch, P. Schmidt, E. Keller and V. Krämer
On the pseudobinary systems Bi2Ch3/BiX3 and the ternary phases in these systems (Ch = S, Se, Te; X = Cl, Br, I). II: Bismutselenidhalides Bi2Se3/BiX3 and bismuttelluridhalides Bi2Te3/BiX3
Zeitschrift für Naturforschung 59b (2004), 727-746

M. Fiederle, H. Braml, A. Fauler, J. Giersch, J. Ludwig and K. Jakobs
IEEE Transactions on Nuclear Science 51(4) (2004), 1799-1802
Development of flip-chip bonding technology for (Cd,Zn)Te

M. Fiederle, A. Fauler, J. P. Konrath, V. Babentsov, J. Franc and R. B. James
IEEE Transactions on Nuclear Science 51(4) (2004), 1864-1868
Comparison of undoped and doped high resistivity CdTe and (Cd,Zn)Te detector crystals

N. V. Sochinskii, V. Babentsov and M. Fiederle
J. of Crystal Growth 262(1-4) (2004), 191-195
Combined photoluminescence study of substrate defects in Hg1-xCdxTe - CdTe heterostructures

A. S. Alikhanian, V. N. Guskov, A. M. Natarovsky, J. H. Greenberg, M. Fiederle and K. W. Benz
Mass spectrometric study of the CdTe-ZnTe system

J. of Alloys and Compounds 371(1-2) (2004), 82-85

K. W. Benz, V. Babentsov and M. Fiederle
Growth of cadmium telluride from the vapor phase under low gravity
Progress in Crystal growth and Characterization of Materials 48(9) (2004), 189-208

M. Fiederle, V. Babentsov, J. Franc, A. Fauler, W. Witte, K. W. Benz and R. B. James
Semi-Insulating cadmium telluride at low impurity concentrations
J. of Material Research 19(2) (2004), 405-408

M. Fiederle, T. Duffar, J. P. Garandet, V. Babentsov, W. Witte, A. Fauler, K. W. Benz, P. Dusserre, V. Corregidor, E. Dieguez, P. Delaye, G. Roosen, V. Chevrier and J. C. Launay
Dewetted growth of CdTe in microgravity (STS-95)
Crystal Research and Technology 39(6) (2004), 481-490

M. Fiederle, T. Duffar, J. P. Garandet, V. Babentsov, W. Witte, A. Fauler, K. W. Benz, P. Dusserre, V. Corregidor, E. Dieguez, P. Delaye, G. Roosen, V. Chevrier and J. C. Launay
Dewetting growth of CdTe on earth
J. of Crystal Growth 267(3-4) (2004)

M. Fiederle, T. Duffar, J. P. Garandet, V. Babentsov, A. Fauler, K. W. Benz, P. Dusserre and J. C. Launay
Dewetted growth and characterisation of high-resistivity CdTe
J. of Crystal of Growth 267(3-4) (2004), 429-435

J. Franc, V. Babentsov, M. Fiederle, E. Belas, R. Grill, K. W. Benz and P. Hoschl
Defect structure of high resistive CdTe:In prepared by Vertical Gadient Freeze method
Crystal Research and Technology 39(6) (2004), 479-480

J. H. Greenberg, V. N. Guskov, M. Fiederle and K. W. Benz
Vapor pressure scanning of non-stoichiometry in Cd0.95Zn0.05Te1+/-?
J. of Crystal Growth 270(1-2) (2004), 69-76

J. H. Greenberg, V. N. Guskov, M. Fiederle and K. W. Benz
Experimental study of non-stoichiometry in Cd1-xZnxTe1+/-?
J. of Electronic Materials 33(6) (2004), 719-723

V. N. Guskov, J. H. Greenberg, M. Fiederle and K. W. Benz
Vapour pressure investigation of CdZnTe
J. of Alloys and Compounds 371(1-2) (2004), 118-121

J. Ludwig, A. Zwerger, K. W. Benz, M. Fiederle, H. Braml, A. Fauler and J. P. Konrath
X-ray energy selected imaging with Medipix II
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 531(1-2) (2004), 209-214

2003

A. Cröll, R. Lantzsch, S. Kitanov, N. Salk, F. R. Szofran and A. Tegetmeier
Melt-crucible wetting behavior in semiconductor melt growth systems
Crystal Research and Technology 38 (2003), 669-675

T. Lyubimova, R. V. Scuridin, A. Cröll and P. Dold
Influence of high frequency vibrations on fluid flow and heat transfer in a floating zone
Crystal Research and Technology 38 (2003), 635-653

A. N. Danilewsky, R. Simon, A. Fauler, M. Fiederle, K. W. Benz
White Beam X-Ray Topography at the Synchrotron Light Source ANKA, Research Centre Karlsruhe
Nuclear Instruments and Methods in Physics Research B, NIM B, 199(1) (2003)

R. Simon, A. N. Danilewsky
The Experimental Station for White Beam X-Ray Topography at the Synchrotron Light Source ANKA, Karlsruhe
Nuclear Instruments and Methods in Physics Research B, NIM B, 199(1) (2003), 550

A. Danilewsky, J. Meinhardt
Macrosegregation in the Growth of doped III-V-semiconductors from the solution
Crystal Research &Technology 38 No.7/8 (2003), 604

M. Fiederle, V. Babentsov, J. Franc, A. Fauler, J.P. Konrath
Growth of high resistivity CdTe and (Cd,Zn)Te crystals
Crystal Research &Technology 38 No.7/8 (2003), 588

P. Dold, M. Heidler, A. Drevermann, and G. Zimmermann
In-situ observation of growth interfaces by ultrasound
J. Crystal Growth, 256(3-4) (2003), 352-360.

M. Benamara, L. Kirste, M. Albrecht, K. W. Benz and H. P. Strunk
Pyramidal-plane ordering in AlGaN alloys
Applied Physics Letters 82(4) (2003), 547-549

A. N. Danilewsky, R. Simon, A. Fauler, M. Fiederle and K. W. Benz
White Beam X-Ray Topography at the Synchrotron Light Source ANKA
Nuclear Instruments and Methods in Physics Research B - Beam Interactions with Materials and Atoms 199(1) (2003), 71-74

M. Fiederle, V. Babentsov, J. Franc, A. Fauler, K. W. Benz and R. B. James
Investigations of CdTe and (Cd,Zn)Te crystals grown by the Bridgman method
Nuclear Instrument Methods Physics Research A: Accelerators, spectrometers, detectors and associated equipment (Netherlands), Netherlands: Elsevier A 509 (2003), 70-75

M. Fiederle, A. Fauler, V. Babentsov, J. Franc, J. Ludwig and K. W. Benz
Characterization of CdTe crystals grown by the vertical Bridgman method
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 509(1-3) (2003), 70-75

J. Franc, M. Fiederle, V. Babentsov, A. Fauler, K. W. Benz and R. B. James
Defect structure of Sn doped CdTe
J. of Electronic Materials 32(7) (2003), 772-777

K. Lin, P. Dold and K. W. Benz
Optimization of thermal conditions during crystal growth in a multi-zone furnace
Crystal Research and Technology 38((2003), 419-428

I. Turkevych, R. Grill, J. Franc, P. Hoschl, E. Belas, P. Moravec, M. Fiederle and K. W. Benz
Preparation of semi-insulating CdTe doped with group IV elements by post growth annealing
Crystal Research & Technology 38(3-5) (2003), 288-296

 

 

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